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Condensed Matter Physics Seminar
Joseph
Woicik
National Institute of Standards and Technology
Local Structure
Determination in Strain Engineered Thin-Film Electronic
Materials by X-ray Absorption Fine
Structure and X-ray Diffraction
X-ray absorption fine structure is combined with x-ray diffraction to study the local atomic structure of strain engineered thin-film electronic materials. Examples will include the local atomic structure of strained-layer semiconductor alloys and ferroelectric SrTiO3 layers on Si. Detailed comparisons will be made with theory.
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